Examiner Kar Yip

Examiner Kar Yip appears to be very difficult relative to their art unit, group, tech center, and USPTO peers. Their lifetime grant ratio is 0.0% and their rejection profile is dominated by §103.

Difficulty vs AU Very Hard

Difficulty vs Group Very Hard

Difficulty vs TC Very Hard

Difficulty vs USPTO Very Hard

Average OA / Grant N/A

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Examiner Details

Observed Examiner Years: 19 years (2008-2026)
Phone: (571) 270-5317
Predicted Supervisor: N/A
Supervisor Phone: N/A
Tech Center: 2800 - Semiconductors, Electrical and Optical Systems and Components
Group: 2850 - Printing / Measuring and Testing

Metrics

Applications Evaluated: 19
Granted Applications: 0
Non-Granted Applications: 19
Avg OA / Grant: N/A
Last OA Observed: March 2026 (0 months ago)
Art Units Seen: 2853 , 2863
Work Groups Seen: 2850 - Printing / Measuring and Testing

2860 - Printing / Measuring and Testing

Context Comparison

Scope	Examiners	Lifetime Grant Ratio	Avg OA / Grant
This Examiner	1	0.0%	N/A
Art Unit	52	64.4%	1.63
Group	372	63.2%	1.66
Tech Center	2,370	64.7%	1.69
USPTO	16,116	54.8%	1.98

Grant Timeline

Shaded region marks the last two observed years, where grant outcomes may lag due to recency.

Year	Applications	Granted	Grant Rate
No observed data before 2008; examiner may not yet have been active in the available dataset.
2008	2	0	0.0%
2009	2	0	0.0%
2010	5	0	0.0%
No observed data for 2011-2012.
2013	2	0	0.0%
2014	1	0	0.0%
2015	1	0	0.0%
2016	2	0	0.0%
No observed data for 2017-2019.
2020	1	0	0.0%
2021	2	0	0.0%
No observed data for 2022-2025.
2026	1	0	0.0%

0 family-cache-validated grants; 0 OA-only grant signals.

Rejection Timeline

OA #	Office Actions	§ 101 Percentage	§ 102 Percentage	§ 103 Percentage	§ 112 Percentage
1	19	0.0%	5.3%	78.9%	5.3%
2	7	0.0%	0.0%	85.7%	0.0%
3	3	0.0%	0.0%	66.7%	0.0%
4	2	0.0%	0.0%	100.0%	0.0%
5	1	0.0%	0.0%	100.0%	0.0%